Nanosecond Impulse Interference Test Generator IGN 4.1M for Technical Equipment Testing

Generator is designed to create normalised packs of nanosecond pulse interference (NIP) in the power supply network and signal circuits during testing of technical means (hereinafter - TS), which can be exposed to NIP according to GOST 30804.4.4-2013 p. 6.1, p. 6.3, GOST IEC 61000-4-4-2016.The generator is supplied with an inbuilt communication-decoupling device (CDD) designed for introduction of NIPs into single-phase AC power supply circuits with voltage 220V and current consumption up to 10A.